Thickness dependence of structure and optoelectronic properties of In2O3:Mo films prepared by spray pyrolysis

Prathap, Pathi, Revathi, Naidu, Ramakrishna Reddy, Kotte and Miles, Robert (2009) Thickness dependence of structure and optoelectronic properties of In2O3:Mo films prepared by spray pyrolysis. Thin Solid Films, 518 (4). pp. 1271-1274. ISSN 0040-6090

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Official URL: http://dx.doi.org/10.1016/j.tsf.2009.01.188

Abstract

The influence of thickness on the structural, morphological and optoelectronic behavior of Mo-doped In2O3 films, prepared by spray pyrolysis was investigated. The films had the cubic crystal structure for all the thicknesses investigated although it was found that a change in the preferred orientation and growth mode, from 2D to 3D, has occurred with an increase of film thickness. A small degradation in the optical transmittance has been observed with the increase of film thickness. The variation of electrical resistivity, mobility and charge carrier concentration with film thickness were also studied and the results discussed.

Item Type: Article
Subjects: H700 Production and Manufacturing Engineering
J500 Materials Technology not otherwise specified
Department: Faculties > Engineering and Environment > Physics and Electrical Engineering
Depositing User: EPrints Services
Date Deposited: 08 Sep 2009 15:44
Last Modified: 11 Mar 2016 14:26
URI: http://nrl.northumbria.ac.uk/id/eprint/1015

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