Toughness measurement of thin films: a critical review

Zhang, Sam, Sun, Deen, Fu, Yong Qing and Du, Hejun (2005) Toughness measurement of thin films: a critical review. Surface and Coatings Technology, 198 (1-3). pp. 74-84. ISSN 0257 8972

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Official URL: http://dx.doi.org/10.1016/j.surfcoat.2004.10.021

Abstract

At present, there is neither standard test procedure nor standard methodology for assessment of toughness of thin films. However, researchers have long been trying to make such measurements, thus a spectrum of test methods have been developed, mostly each in its own way. As qualitative or semiquantitative assessment, a simple plasticity measurement or scratch adhesion test can mostly suffice. For quantitative description, however, a choice of bending, buckling, indentation, scratching, or tensile test has to be made. These testing methods are either stress-based or energy-based. This paper gives a critical review on these methods and concludes that, for thin films, the energy-based approach, especially the one independent of substrate, is more advantageous.

Item Type: Article
Uncontrolled Keywords: Toughness; Toughness measurement; Thin films; Coatings
Subjects: F200 Materials Science
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 27 Mar 2015 09:17
Last Modified: 24 Oct 2017 08:54
URI: http://nrl.northumbria.ac.uk/id/eprint/21866

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