Toughness measurement of thin films: a critical review

Zhang, Sam, Sun, Deen, Fu, Yong Qing and Du, Hejun (2005) Toughness measurement of thin films: a critical review. Surface and Coatings Technology, 198 (1-3). pp. 74-84. ISSN 0257 8972

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At present, there is neither standard test procedure nor standard methodology for assessment of toughness of thin films. However, researchers have long been trying to make such measurements, thus a spectrum of test methods have been developed, mostly each in its own way. As qualitative or semiquantitative assessment, a simple plasticity measurement or scratch adhesion test can mostly suffice. For quantitative description, however, a choice of bending, buckling, indentation, scratching, or tensile test has to be made. These testing methods are either stress-based or energy-based. This paper gives a critical review on these methods and concludes that, for thin films, the energy-based approach, especially the one independent of substrate, is more advantageous.

Item Type: Article
Uncontrolled Keywords: Toughness; Toughness measurement; Thin films; Coatings
Subjects: F200 Materials Science
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 27 Mar 2015 09:17
Last Modified: 24 Oct 2017 08:54

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