Chemical analysis of Cd1−xZnxS/CdTe solar cells by plasma profiling TOFMS

Kartopu, Giray, Tempez, Agnès, Clayton, Andrew, Barrioz, Vincent, Irvine, Stuart, Olivero, Celia, Chapon, Patrick, Legendre, Sebastien and Cooper, John (2014) Chemical analysis of Cd1−xZnxS/CdTe solar cells by plasma profiling TOFMS. Materials Research Innovations, 9 (1). pp. 82-85. ISSN 1432-8917

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Official URL: http://dx.doi.org/10.1179/1433075X14Y.0000000207

Abstract

Thin film CdTe photovoltaic (PV) devices and reference layers obtained by the atmospheric pressure metalorganic vapour deposition (AP-MOCVD) method have been studied for their chemical structure using plasma profiling time-of-flight-mass spectroscopy (PP-TOFMS, also called glow discharge TOFMS). Different levels of arsenic (As) dopant in CdTe films were measured by PP-TOFMS and compared to results obtained from a more conventional depth profiling method (secondary ion mass spectrometry or SIMS). This comparison showed that PP-TOFMS has the sufficient sensitivity towards detection of the As dopant in CdTe and hence is suited as a rapid, low vacuum tool in controlling the large scale production of CdTe PV materials.

Item Type: Article
Uncontrolled Keywords: CdTe thin film PV, Glow discharge, Plasma profiling (PP)-TOFMS, Depth profiling
Subjects: F200 Materials Science
Department: Faculties > Engineering and Environment > Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 23 Nov 2015 15:12
Last Modified: 17 Mar 2016 11:35
URI: http://nrl.northumbria.ac.uk/id/eprint/24689

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