A Rapid Screening Method for Investigating the Effect of Processing Parameters on CdTe/CdS Solar Cell Performance

Al Turkestani, Mohammed, Durose, Ken, Wakeling, Ben, Lane, David, Irvine, Stuart and Barrioz, Vincent (2009) A Rapid Screening Method for Investigating the Effect of Processing Parameters on CdTe/CdS Solar Cell Performance. MRS Proceedings, 1165. ISSN 1946-4274

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Official URL: http://dx.doi.org/10.1557/PROC-1165-M05-17

Abstract

A rapid screening method is reported in which material processing parameters are investigated as a function of the CdTe absorber thickness in CdTe/CdS solar cells. It has been used to investigate i) the optimum absorber thickness for CdCl2 processing at 380°C for 10 mins, and ii) the effect on device performance of post-growth annealing of CdS layer with H2, N2, and O2. It was found that the optimum thickness of CdTe compatible with the processing was ∼3μm. The device results were independent of the post-growth treatment of the CdS for the conditions investigated here. The bevel method allowed for ∼30 data points to be obtained from each sample, this giving a significant advantage over conventional experimental methods.

Item Type: Article
Uncontrolled Keywords: Cd; Te; S
Subjects: F200 Materials Science
Department: Faculties > Engineering and Environment > Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 23 Nov 2015 16:21
Last Modified: 23 Nov 2015 16:21
URI: http://nrl.northumbria.ac.uk/id/eprint/24706

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