Crystal size induced reduction in thermal hysteresis of Ni-Ti-Nb shape memory thin films

Li, K., Li, Yan, Yu, K. Y., Liu, C., Gibson, Desmond, Leyland, A., Matthews, A. and Fu, Yong Qing (2016) Crystal size induced reduction in thermal hysteresis of Ni-Ti-Nb shape memory thin films. Applied Physics Letters, 108 (17). p. 171907. ISSN 0003-6951

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Official URL: http://dx.doi.org/10.1063/1.4948377

Abstract

Ni41.7Ti38.8Nb19.5shape memoryalloyfilms were sputter-deposited onto silicon substrates and annealed at various temperatures. A narrow thermal hysteresis was obtained in the Ni-Ti-Nb films with a grain size of less than 50 nm. The small grain size, which means an increase in the volume fraction of grain boundaries, facilitates the phase transformation and reduces the hysteresis. The corresponding less transformation friction and lower heat transfer during the shear process, as well as reduced spontaneous lattice distortion, are responsible for this reduction of the thermal hysteresis.

Item Type: Article
Subjects: F200 Materials Science
Department: Faculties > Engineering and Environment > Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 18 Apr 2016 13:35
Last Modified: 20 Aug 2017 22:04
URI: http://nrl.northumbria.ac.uk/id/eprint/26579

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