Micromachined sample stages to reduce thermal drift in atomic force microscopy

Sevim, Semih, Tolunay, Selin and Torun, Hamdi (2015) Micromachined sample stages to reduce thermal drift in atomic force microscopy. Microsystem Technologies, 21 (7). pp. 1559-1566. ISSN 0946-7076

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Official URL: https://doi.org/10.1007/s00542-014-2251-3
Item Type: Article
Subjects: H600 Electronic and Electrical Engineering
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Ellen Cole
Date Deposited: 20 Feb 2018 15:47
Last Modified: 20 Feb 2018 15:47
URI: http://nrl.northumbria.ac.uk/id/eprint/33440

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