Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range

Torun, Hamdi, Torello, D. and Degertekin, F. L. (2011) Note: Seesaw actuation of atomic force microscope probes for improved imaging bandwidth and displacement range. Review of Scientific Instruments, 82 (8). 086104. ISSN 0034-6748

Full text not available from this repository.
Official URL: http://dx.doi.org/10.1063/1.3622748

Abstract

The authors describe a method of actuation for atomic force microscope (AFM) probes to improve imaging speed and displacement range simultaneously. Unlike conventional piezoelectric tube actuation, the proposed method involves a lever and fulcrum “seesaw” like actuation mechanism that uses a small, fast piezoelectric transducer. The lever arm of the seesaw mechanism increases the apparent displacement range by an adjustable gain factor, overcoming the standard tradeoff between imaging speed and displacement range. Experimental characterization of a cantilever holder implementing the method is provided together with comparative line scans obtained with contact mode imaging. An imaging bandwidth of 30 kHz in air with the current setup was demonstrated.

Item Type: Article
Subjects: F300 Physics
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 19 Dec 2018 12:54
Last Modified: 19 Dec 2018 12:54
URI: http://nrl.northumbria.ac.uk/id/eprint/37360

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