Fu, Yong Qing, Du, Hejun and Zhang, Sam (2003) Functionally graded TiN/TiNi shape memory alloy films. Materials Letters, 57 (20). pp. 2995-2999. ISSN 0167-577X
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Official URL: http://dx.doi.org/10.1016/S0167-577X(02)01419-2
Abstract
The presence of an adherent and hard TiN layer (200 nm) on TiNi-based shape memory alloy (SMA) film (3.5 μm) formed a passivation layer, improved hardness and tribological properties, without sacrificing the phase transformation and shape memory effect of the TiNi film.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | TiNi; Thin films; TiN; Sputtering; Shape memory |
| Subjects: | F200 Materials Science |
| Department: | Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering |
| Depositing User: | Becky Skoyles |
| Date Deposited: | 26 Mar 2015 12:10 |
| Last Modified: | 12 Oct 2019 19:05 |
| URI: | http://nrl.northumbria.ac.uk/id/eprint/21808 |
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