Preparation and characterization of transparent conducting ZnS:Al films

Prathap, Pathi, Revathi, Naidu, Subbaiah, Yerva, Ramakrishna Reddy, Kotte and Miles, Robert (2009) Preparation and characterization of transparent conducting ZnS:Al films. Solid State Sciences, 11 (1). pp. 224-232. ISSN 1293-2558

Full text not available from this repository. (Request a copy)
Official URL:


Al-doped ZnS films were deposited using close-spaced evaporation of the powders synthesized by chemical precipitation method. The films were prepared for different Al concentrations in the range 0–10at.% on glass substrates kept at 300°C. The effect of Al-doping on ZnS composition, microstructure and optoelectronic properties of as-grown ZnS layers was determined using appropriate techniques. The films were polycrystalline and showed (111) preferred orientation for all the doping concentrations in spite of an additional phase of Al2S3 observed at higher dopant levels. The surface morphological studies indicated that the Al incorporation had a considerable effect on the surface roughness of the films. The optical measurements indicated that the optical energy band gap decreased slightly with the increase of dopant concentration without affecting the optical transmittance characteristics significantly. The electrical analysis indicated that the resistivity of the layers changed significantly with the doping concentration in the layers. The change of photoluminescence behaviour of the as-grown ZnS:Al films with dopant concentration was also studied.

Item Type: Article
Uncontrolled Keywords: ZnS films, close-spaced evaporation, structure, optical properties
Subjects: F300 Physics
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: EPrint Services
Date Deposited: 20 Aug 2009 11:34
Last Modified: 12 Oct 2019 19:06

Actions (login required)

View Item View Item


Downloads per month over past year

View more statistics