Athermal atomic force microscope probes

Georgia Tech Research Corp; Torun, Hamdi; Degertekin, Fahrettin; Finkler, Ofer (2012) Athermal atomic force microscope probes. US8239968B2.

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An atomic force microscopy system includes an imaging probe having a first thermal displacement constant and a sample placement surface. At least a portion of the sample placement surface has a second thermal displacement constant. The sample placement surface is spaced apart from the imaging probe at a predetermined displacement. The sample placement surface is configured so that the second thermal displacement constant matches the first thermal displacement constant so that when the imaging probe and the sample placement surface are subject to a predetermined temperature, both the portion of the sample placement surface and the imaging prove are displaced by a same distance.

Item Type: Patent
Subjects: F300 Physics
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 10 Jul 2018 15:09
Last Modified: 10 Jul 2018 15:09

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