Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling

Finkler, O., Degertekin, F. L. and Torun, Hamdi (2009) Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling. Review of Scientific Instruments, 80 (7). 076103. ISSN 0034-6748

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Abstract

The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both structures are read out simultaneously. The matched structure displaces with the AFM probe as temperature changes, thus the force applied to the sample can be kept constant without the need for a separate feedback loop for thermal drift compensation, and the differential signal can be used to cancel the shift in zero-force level of the AFM.

Item Type:	Article
Uncontrolled Keywords:	atomic force microscopy, crystal microstructure, feedback, probes
Subjects:	B800 Medical Technology
Department:	Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User:	Paul Burns
Date Deposited:	14 Jan 2019 16:21
Last Modified:	11 Oct 2019 14:34
URI:	http://nrl.northumbria.ac.uk/id/eprint/37574

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