Items where Author is "Corrigan, Damion K."
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Schmueser, Ilka, Blair, Ewen O., Isiksacan, Ziya, Li, Yifan, Corrigan, Damion K., Stokes, Adam A., Terry, Jonathan G., Mount, Andrew R. and Walton, Anthony J. (2020) Test structure and measurement system for characterising the electrochemical performance of nanoelectrode structures. In: 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). IEEE, Piscataway, NJ, pp. 1-6. ISBN 9781728140087
