Items where Author is "Faulkner, C. C."

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Petit, D., Faulkner, C. C., Johnstone, S., Wood, David and Cowburn, R. P. (2005) Nanometer scale patterning using focused ion beam milling. Review of Scientific Instruments, 76 (2). 026105. ISSN 0034-6748

This list was generated on Thu Jan 23 15:04:20 2020 UTC.