Items where Author is "Fung, Steve"

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Number of items: 6.

Liu, Yang, Chen, Tu Pei, Ding, L., Zhang, Sam, Fu, Yong Qing and Fung, Steve (2006) Charging mechanism in a SiO[sub 2] matrix embedded with Si nanocrystals. Journal of Applied Physics, 100 (9). 096111. ISSN 0021 8979

Liu, Yang, Chen, Tu Pei, Ng, C. Y., Ding, L., Zhang, Sam, Fu, Yong Qing and Fung, Steve (2006) Depth Profiling of Charging Effect of Si Nanocrystals Embedded in SiO2: A Study of Charge Diffusion among Si Nanocrystals. The Journal of Physical Chemistry B, 110 (33). pp. 16499-16502. ISSN 1520-6106

Liu, Yang, Chen, Tu Pei, Ng, C. Y., Tse, Man Siu, Zhao, P., Fu, Yong Qing, Zhang, Sam and Fung, Steve (2005) Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric. Nanotechnology, 16 (8). pp. 1119-1122. ISSN 0957-4484

Liu, Yang, Chen, Tu Pei, Zhao, P., Zhang, Sam, Fung, Steve and Fu, Yong Qing (2005) Memory effect of Al-rich AlN films synthesized with rf magnetron sputtering. Applied Physics Letters, 87 (3). 033112. ISSN 0003 6951

Chen, Tu Pei, Liu, Yang, Sun, Chang Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Fu, Yong Qing, Liu, Y. C. and Fung, Steve (2004) Core-Level Shift of Si Nanocrystals Embedded in a SiO2 Matrix. The Journal of Physical Chemistry B, 108 (43). pp. 16609-16612. ISSN 1520-6106

Liu, Yang, Fu, Yong Qing, Chen, Tu Pei, Tse, Man Siu, Fung, Steve, Hsieh, Jang-Hsing and Yang, Xiao Hong (2003) Depth Profiling of Si Oxidation States in Si-Implanted SiO2Films by X-Ray Photoelectron Spectroscopy. Japanese Journal of Applied Physics, 42 (Part 2). L1394-L1396. ISSN 0021-4922

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