Items where Author is "Hsieh, Jang-Hsing"

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Tang, Z. Z., Hsieh, Jang-Hsing, Zhang, Shanyong, Li, C. and Fu, Yong Qing (2005) Phase transition and microstructure change in Ta–Zr alloy films by co-sputtering. Surface and Coatings Technology, 198 (1-3). pp. 110-113. ISSN 0257 8972

Liu, Yang, Chen, Tu Pei, Fu, Yong Qing and Hsieh, Jang-Hsing (2005) Characterization of Si nanocrystals embedded in SiO2 with X-Ray photoelectron spectroscopy. Journal of Metastable and Nanocrystalline Materials, 23. pp. 11-14. ISSN 1422-6375

Chen, Tu Pei, Liu, Yang, Sun, Chang Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Fu, Yong Qing, Liu, Y. C. and Fung, Steve (2004) Core-Level Shift of Si Nanocrystals Embedded in a SiO2 Matrix. The Journal of Physical Chemistry B, 108 (43). pp. 16609-16612. ISSN 1520-6106

Wang, Chien Ming, Hsieh, Jang-Hsing, Fu, Yong Qing, Li, C., Chen, Tu Pei and Lam, U. T. (2004) Electrical properties of TaN–Cu nanocomposite thin films. Ceramics International, 30 (7). pp. 1879-1883. ISSN 0272 8842

Liu, Yang, Fu, Yong Qing, Chen, Tu Pei, Tse, Man Siu, Fung, Steve, Hsieh, Jang-Hsing and Yang, Xiao Hong (2003) Depth Profiling of Si Oxidation States in Si-Implanted SiO2Films by X-Ray Photoelectron Spectroscopy. Japanese Journal of Applied Physics, 42 (Part 2). L1394-L1396. ISSN 0021-4922

Liu, Yang, Chen, Tu Pei, Fu, Yong Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Ho, P. F. and Liu, Y. C. (2003) A study on Si nanocrystal formation in Si-implanted SiO2 films by x-ray photoelectron spectroscopy. Journal of Physics D: Applied Physics, 36 (19). L97-L100. ISSN 0022-3727

Sun, Chang Qing, Fu, Yong Qing, Yan, Bibo, Hsieh, Jang-Hsing, Lau, S. P., Sun, Xiaowei and Tay, Beng Kang (2002) Improving diamond–metal adhesion with graded TiCN interlayers. Journal of Applied Physics, 91 (4). p. 2051. ISSN 0021 8979

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