Items where Author is "Hsieh, Jang-Hsing"

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Number of items: 7.

Article

Tang, Z. Z., Hsieh, Jang-Hsing, Zhang, Shanyong, Li, C. and Fu, Yong Qing (2005) Phase transition and microstructure change in Ta–Zr alloy films by co-sputtering. Surface and Coatings Technology, 198 (1-3). pp. 110-113. ISSN 0257 8972

Liu, Yang, Chen, Tu Pei, Fu, Yong Qing and Hsieh, Jang-Hsing (2005) Characterization of Si nanocrystals embedded in SiO2 with X-Ray photoelectron spectroscopy. Journal of Metastable and Nanocrystalline Materials, 23. pp. 11-14. ISSN 1422-6375

Chen, Tu Pei, Liu, Yang, Sun, Chang Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Fu, Yong Qing, Liu, Y. C. and Fung, Steve (2004) Core-Level Shift of Si Nanocrystals Embedded in a SiO2 Matrix. The Journal of Physical Chemistry B, 108 (43). pp. 16609-16612. ISSN 1520-6106

Wang, Chien Ming, Hsieh, Jang-Hsing, Fu, Yong Qing, Li, C., Chen, Tu Pei and Lam, U. T. (2004) Electrical properties of TaN–Cu nanocomposite thin films. Ceramics International, 30 (7). pp. 1879-1883. ISSN 0272 8842

Liu, Yang, Fu, Yong Qing, Chen, Tu Pei, Tse, Man Siu, Fung, Steve, Hsieh, Jang-Hsing and Yang, Xiao Hong (2003) Depth Profiling of Si Oxidation States in Si-Implanted SiO2Films by X-Ray Photoelectron Spectroscopy. Japanese Journal of Applied Physics, 42 (Part 2). L1394-L1396. ISSN 0021-4922

Liu, Yang, Chen, Tu Pei, Fu, Yong Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Ho, P. F. and Liu, Y. C. (2003) A study on Si nanocrystal formation in Si-implanted SiO2 films by x-ray photoelectron spectroscopy. Journal of Physics D: Applied Physics, 36 (19). L97-L100. ISSN 0022-3727

Sun, Chang Qing, Fu, Yong Qing, Yan, Bibo, Hsieh, Jang-Hsing, Lau, S. P., Sun, Xiaowei and Tay, Beng Kang (2002) Improving diamond–metal adhesion with graded TiCN interlayers. Journal of Applied Physics, 91 (4). p. 2051. ISSN 0021 8979

This list was generated on Mon Jan 27 01:13:23 2020 UTC.