Items where Author is "Marcroft, Claire"

Article

McCay, Kevin, Hu, Pengpeng, Shum, Hubert P. H., Woo, Wai Lok, Marcroft, Claire, Embleton, Nicholas D., Munteanu, Adrian and Ho, Edmond (2022) A Pose-based Feature Fusion and Classification Framework for the Early Prediction of Cerebral Palsy in Infants. IEEE Transactions on Neural Systems and Rehabilitation Engineering, 30. pp. 8-19. ISSN 1534-4320

Sakkos, Dimitrios, McCay, Kevin D., Marcroft, Claire, Embleton, Nicholas D., Chattopadhyay, Samiran and Ho, Edmond S. L. (2021) Identification of Abnormal Movements in Infants: A Deep Neural Network for Body Part-based Prediction of Cerebral Palsy. IEEE Access, 9. pp. 94281-94292. ISSN 2169-3536

Ho, Edmond, McCay, Kevin, Shum, Hubert, Fehringer, Gerhard, Marcroft, Claire and Embleton, Nicholas (2020) Abnormal Infant Movements Classification With Deep Learning on Pose-Based Features. IEEE Access, 8. pp. 51582-51592. ISSN 2169-3536

Lord, Clarissa, Rapley, Timothy, Marcroft, Claire, Pearse, Janice and Basu, Anna (2018) Determinants of parent-delivered therapy interventions in children with cerebral palsy: A qualitative synthesis and checklist. Child: Care, Health and Development, 44 (5). pp. 659-669. ISSN 0305-1862

Book Section

McCay, Kevin D., Ho, Edmond, Sakkos, Dimitris, Woo, Wai Lok, Marcroft, Claire, Dulson, Patricia and Embleton, Nicholas D. (2021) Towards Explainable Abnormal Infant Movements Identification: A Body-part Based Prediction and Visualisation Framework. In: 2021 IEEE EMBS International Conference on Biomedical and Health Informatics (BHI). IEEE EMBS International Conference on Biomedical and Health Informatics . IEEE, Piscataway, p. 9508603. ISBN 9781665403580, 9781665447706

McCay, Kevin, Ho, Edmond, Marcroft, Claire and Embleton, Nicholas D. (2019) Establishing Pose Based Features Using Histograms for the Detection of Abnormal Infant Movements. In: 2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC) (EMBC 2019): Berlin, Germany, July 23-27, 2019. IEEE, Piscataway, NJ, pp. 5469-5472. ISBN 9781538613122, 9781538613115