Items where Author is "Ngoi, Bryan"

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Article

Xie, D. Z., Ngoi, Bryan, Fu, Yong Qing, Ong, A. S. and Lim, B. H. (2004) Etching characteristics of TiNi thin film by focused ion beam. Applied Surface Science, 225 (1-4). pp. 54-58. ISSN 0169 4332

Xie, D. Z., Ngoi, Bryan, Ong, A. S., Fu, Yong Qing and Lim, B. H. (2003) Focused ion beam micromachining of TiNi film on Si(111). Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 211 (3). pp. 363-368. ISSN 0168-583X

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