Items where Author is "Tian, Gui Yun"

Article

Xiang, Ju, Zhao, Aobo, Tian, Gui Yun, Woo, Wai Lok, Liu, Lingxiu, Li, Hang and Singh, Pradeep Kumar (2022) Prospective RFID Sensors for the IoT Healthcare System. Journal of Sensors, 2022. p. 8787275. ISSN 1687-725X

Chen, Xiaotian, Tian, Gui Yun, Ding, Song, Ahmed, Junaid and Woo, Wai Lok (2021) Tomographic Reconstruction of Rolling Contact Fatigues in Rails using 3D Eddy Current Pulsed Thermography. IEEE Sensors Journal, 21 (17). pp. 18488-18496. ISSN 1530-437X

Li, Haoran, Gao, Bin, Miao, Ling, Liu, Dong, Ma, Qiuping, Tian, Gui Yun and Woo, Wai Lok (2021) Multiphysics Structured Eddy Current and Thermography Defects Diagnostics System in Moving Mode. IEEE Transactions on Industrial Informatics, 17 (4). pp. 2566-2578. ISSN 1551-3203

Gao, Bin, Lu, Peng, Woo, Wai Lok, Tian, Gui Yun, Zhu, Yuyu and Johnston, Martin (2018) Variational Bayesian Subgroup Adaptive Sparse Component Extraction for Diagnostic Imaging System. IEEE Transactions on Industrial Electronics, 65 (10). pp. 8142-8152. ISSN 0278-0046

Xiao, Xiang, Gao, Bin, Woo, Wai Lok, Tian, Gui Yun and Xiao, Xiao Ting (2018) Spatial-time-state fusion algorithm for defect detection through eddy current pulsed thermography. Infrared Physics & Technology, 90. pp. 133-145. ISSN 1350-4495

Zhu, Yuyu, Gao, Bin, Tian, Gui Yun, Woo, Wai Lok, Tang, Guangping, Sun, Chaoming and Li, Jianwen (2017) Nondestructive Testing for Multi-Layer Metal-Metal Bonded Structure by Using Inductive Lock-In Thermograhy. IEEE Sensors Journal, 17 (20). pp. 6716-6723. ISSN 1530-437X

Zhao, Jian, Gao, Bin, Woo, Wai Lok, Qiu, Fasheng and Tian, Gui Yun (2017) Crack Evaluation Based on Novel Circle-Ferrite Induction Thermography. IEEE Sensors Journal, 17 (17). pp. 5637-5645. ISSN 1530-437X

Lu, Peng, Gao, Bin, Feng, Qizhi, Yang, Yang, Woo, Wai Lok and Tian, Gui Yun (2017) Ensemble variational Bayes tensor factorization for super resolution of CFRP debond detection. Infrared Physics & Technology, 85. pp. 335-346. ISSN 1350-4495

Lu, Peng, Gao, Bin, Woo, Wai Lok, Li, Xiaoqing and Tian, Gui Yun (2017) Automatic Relevance Determination of Adaptive Variational Bayes Sparse Decomposition for Micro-Cracks Detection in Thermal Sensing. IEEE Sensors Journal, 17 (16). pp. 5220-5230. ISSN 1530-437X

Zhou, Guorui, Wu, Qiang, Kumar, Rahul, Ng, Wai Pang, Liu, Hao, Niu, Longfei, Lalam, Nageswara, Yuan, Xiaodong, Semenova, Yuliya, Farrell, Gerald, Yuan, Jinhui, Yu, Chongxiu, Zeng, Jie, Tian, Gui Yun and Fu, Yong Qing (2017) High Sensitivity Refractometer Based on Reflective Smf-Small Diameter No Core Fiber Structure. Sensors, 17 (6). p. 1415. ISSN 1424-8220

Gao, Yunlai, Tian, Gui Yun, Wang, Ping, Wang, Haitao, Gao, Bin, Woo, Wai Lok and Li, Kongjing (2017) Electromagnetic pulsed thermography for natural cracks inspection. Scientific Reports, 7. p. 42073. ISSN 2045-2322

Li, Xiaoqing, Gao, Bin, Woo, Wai Lok, Tian, Gui Yun, Qiu, Xueshi and Gu, Liangyong (2017) Quantitative Surface Crack Evaluation Based on Eddy Current Pulsed Thermography. IEEE Sensors Journal, 17 (2). pp. 412-421. ISSN 1530-437X

Gao, Bin, Woo, Wai Lok and Tian, Gui Yun (2016) Electromagnetic Thermography Nondestructive Evaluation: Physics-based Modeling and Pattern Mining. Scientific Reports, 6. p. 25480. ISSN 2045-2322

Gao, Bin, Woo, Wai Lok, He, Yunze and Tian, Gui Yun (2016) Unsupervised Sparse Pattern Diagnostic of Defects With Inductive Thermography Imaging System. IEEE Transactions on Industrial Informatics, 12 (1). pp. 371-383. ISSN 1551-3203

Gao, Bin, Woo, Wai Lok, Tian, Gui Yun and Zhang, Hong (2016) Unsupervised Diagnostic and Monitoring of Defects Using Waveguide Imaging With Adaptive Sparse Representation. IEEE Transactions on Industrial Informatics, 12 (1). pp. 405-416. ISSN 1551-3203

Zhang, Hong, Gao, Bin, Tian, Gui Yun, Woo, Wai Lok and Simm, Anthony (2014) Spatial-Frequency Spectrum Characteristics Analysis With Different Lift-Offs for Microwave Nondestructive Testing and Evaluation Using Itakura-Saito Nonnegative Matrix Factorization. IEEE Sensors Journal, 14 (6). pp. 1822-1830. ISSN 1530-437X

Cheng, Liang, Gao, Bin, Tian, Gui Yun, Woo, Wai Lok and Berthiau, Gerard (2014) Impact Damage Detection and Identification Using Eddy Current Pulsed Thermography Through Integration of PCA and ICA. IEEE Sensors Journal, 14 (5). pp. 1655-1663. ISSN 1530-437X

Gao, Bin, Bai, Libing, Woo, Wai Lok, Tian, Gui Yun and Cheng, Yuhua (2014) Automatic Defect Identification of Eddy Current Pulsed Thermography Using Single Channel Blind Source Separation. IEEE Transactions on Instrumentation and Measurement, 63 (4). pp. 913-922. ISSN 0018-9456

Gao, Bin, Zhang, Hong, Woo, Wai Lok, Tian, Gui Yun, Bai, Libing and Yin, Aijun (2014) Smooth Nonnegative Matrix Factorization for Defect Detection Using Microwave Nondestructive Testing and Evaluation. IEEE Transactions on Instrumentation and Measurement, 63 (4). pp. 923-934. ISSN 0018-9456

Zhang, Hong, Gao, Bin, Tian, Gui Yun, Woo, Wai Lok and Bai, Libing (2013) Metal defects sizing and detection under thick coating using microwave NDT. NDT & E International, 60. pp. 52-61. ISSN 0963-8695

Bai, Libing, Gao, Bin, Tian, Shulin, Cheng, Yuhua, Chen, Yifan, Tian, Gui Yun and Woo, Wai Lok (2013) A comparative study of principal component analysis and independent component analysis in eddy current pulsed thermography data processing. Review of Scientific Instruments, 84 (10). p. 104901. ISSN 0034-6748

Bai, Libing, Gao, Bin, Tian, Gui Yun, Woo, Wai Lok and Cheng, Yuhua (2013) Spatial and Time Patterns Extraction of Eddy Current Pulsed Thermography Using Blind Source Separation. IEEE Sensors Journal, 13 (6). pp. 2094-2101. ISSN 1530-437X

Conference or Workshop Item

Gao, Bin, Bai, Libing, Woo, Wai Lok, Tian, Gui Yun and Cheng, Yuhua (2013) Single channel blind source separation for defect identification using Eddy Current Pulsed Thermography. In: FENDT 2013 - 2013 Far East Forum on Nondestructive Evaluation/Testing, 17th - 20th June 2013, Ji'nan, China.

Simm, Anthony, Abidin, Ilham Zainal, Tian, Gui Yun and Woo, Wai Lok (2010) Simulation and Visualisation for Electromagnetic Nondestructive Evaluation. In: IV 2010 - 14th International Conference on Information Visualisation, 26th - 29th July 2010, London, UK.