Items where Author is "Wang, C."

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Conference or Workshop Item

Wang, C., Xu, Ben, Terry, Jonathan, Smith, Stewart, Walton, Anthony and Li, Yifan (2017) Test Structures for Stepwise Deformation Sensing on Super-flexible Strain Sensors. In: Microelectronic Test Structures (ICMTS), 2017 IEEE International Conference on, 27-30 March 2017, Grenoble.

This list was generated on Fri Jan 24 06:12:58 2020 UTC.