Items where Author is "Zhang, R."

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Zhang, R., Li, Yifan, Murray, J., Bunting, A., Smith, S., Dunare, C., Stevenson, J., Desmulliez, Marc and Walton, Anthony (2013) Test structures for electrical evaluation of high aspect ratio TSV arrays fabricated using planarised sacrificial photoresist. In: Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. IEEE, Piscataway, NJ, pp. 37-42. ISBN 978-1-4673-4845-4

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