Test structures and a measurement system for characterising the lifetime of EWOD devices

Gruber, D., Li, Yifan, Smith, Stewart, Tiwari, Abishek, Deng, F., Stokes, Adam, Terry, Jonathan, Bunting, A., Mackay, Logan and Langridge-Smith, Pat (2011) Test structures and a measurement system for characterising the lifetime of EWOD devices. In: Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on. IEEE, Piscataway, NJ, pp. 80-84. ISBN 978-1-4244-8526-0

Full text not available from this repository. (Request a copy)
Official URL: http://dx.doi.org/10.1109/ICMTS.2011.5976864


This paper presents a methodology together with a characterisation system for rapidly and quantitatively evaluating the lifetime and reliability of Electro-Wetting-on-Dielectric (EWOD) microfluidic devices. By studying the contact angle (CA) change when electrowetting forces are applied on the test structure, the number of times of a droplet can be switched between relaxed and actuated states can be characterised. This paper describes the development of an automated measurement system together with test structures designed to quickly characterise and optimise EWOD dielectric layer compositions. This enables the rapid determination of the driving voltage that results in the longest lifetime of the device, providing the tools to optimise both the process, architecture and the voltage driving scheme.

Item Type: Book Section
Subjects: F200 Materials Science
F300 Physics
H600 Electronic and Electrical Engineering
Department: Faculties > Engineering and Environment > Mechanical and Construction Engineering
Depositing User: Yifan Li
Date Deposited: 26 Feb 2015 15:33
Last Modified: 12 Oct 2019 12:13
URI: http://nrl.northumbria.ac.uk/id/eprint/21229

Actions (login required)

View Item View Item


Downloads per month over past year

View more statistics