In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films

Wang, Hong, Sun, Guangai, Wang, Xiaolin, Chen, Bo, Zu, Xiao-Tao, Liu, Yanping, Li, Liangbin, Pan, Guoqiang, Sheng, Liusi, Liu, Yaoguang and Fu, Yong Qing (2015) In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti–Ni-based thin films. Journal of Synchrotron Radiation, 22 (1). pp. 34-41. ISSN 1600-5775

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Deformation mechanisms of as-deposited and post-annealed Ti50.2Ni49.6, Ti50.3Ni46.2Cu3.5 and Ti48.5Ni40.8Cu7.5 thin films were investigated using the in situ synchrotron X-ray diffraction technique. Results showed that initial crystalline phases determined the deformation mechanisms of all the films during tensile loading. For the films dominated by monoclinic martensites (B19'), tensile stress induced the detwinning of <011> type-II twins and resulted in the preferred orientations of (002)B19' parallel to the loading direction (|| LD) and (020)B19' perpendicular to the LD ([perpendicular] LD). For the films dominated by austenite (B2), the austenite directly transformed into martensitic variants (B19') with preferred orientations of (002)B19' || LD and (020)B19' [perpendicular] LD. For the Ti50.3Ni46.2Cu3.5 and Ti48.1Ni40.8Cu7.5 films, martensitic transformation temperatures decreased apparently after post-annealing because of the large thermal stress generated in the films due to the large differences in thermal expansion coefficients between the film and substrate.

Item Type: Article
Additional Information: Available under Creative Commons Attribution 2.0 Licence (
Uncontrolled Keywords: Shape memory, Ti-Ni, thin film, deformation behaviour, detwinning, synchrotron X-ray diffraction
Subjects: F200 Materials Science
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Becky Skoyles
Date Deposited: 23 Mar 2015 09:38
Last Modified: 01 Aug 2021 03:46

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