Wang, Zhiguo, Zu, Xiao-Tao, Fu, Yong Qing, Zhu, Shengtao and Wang, L. M. (2005) Electron irradiation effect on the reverse phase transformation temperatures in TiNi shape memory alloy thin films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 227 (3). pp. 337-342. ISSN 0168-583X
Full text not available from this repository. (Request a copy)Abstract
In this work, Ti–Ni shape memory alloy thin films were irradiated by 1.7 MeV electron with three types of fluences: 4 × 1020, 7 × 1020 and 1 × 1021/m2. The influence of electron irradiation on the transformation behavior of the TiNi thin films were investigated by differential scanning calorimetry. The transformation temperatures As and Af shifted to higher temperature after electron irradiation, the martensite was stabilized. The electron irradiation effect can be easily eliminated by one thermal cycle. The shifts of the transformation temperatures can be explained from the change of potential energy barrier and coherency energy between parent phase and martensite after irradiation.
Item Type: | Article |
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Uncontrolled Keywords: | TiNi thin films; Electron irradiation; Martensitic transformation; DSC |
Subjects: | F200 Materials Science |
Department: | Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering |
Depositing User: | Becky Skoyles |
Date Deposited: | 26 Mar 2015 16:22 |
Last Modified: | 12 Oct 2019 19:06 |
URI: | http://nrl.northumbria.ac.uk/id/eprint/21846 |
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