Toughness measurement of thin films: a critical review

Zhang, Sam, Sun, Deen, Fu, Yong Qing and Du, Hejun (2005) Toughness measurement of thin films: a critical review. Surface and Coatings Technology, 198 (1-3). pp. 74-84. ISSN 0257 8972

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Abstract

At present, there is neither standard test procedure nor standard methodology for assessment of toughness of thin films. However, researchers have long been trying to make such measurements, thus a spectrum of test methods have been developed, mostly each in its own way. As qualitative or semiquantitative assessment, a simple plasticity measurement or scratch adhesion test can mostly suffice. For quantitative description, however, a choice of bending, buckling, indentation, scratching, or tensile test has to be made. These testing methods are either stress-based or energy-based. This paper gives a critical review on these methods and concludes that, for thin films, the energy-based approach, especially the one independent of substrate, is more advantageous.

Item Type:	Article
Uncontrolled Keywords:	Toughness; Toughness measurement; Thin films; Coatings
Subjects:	F200 Materials Science
Department:	Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User:	Becky Skoyles
Date Deposited:	27 Mar 2015 09:17
Last Modified:	12 Oct 2019 19:06
URI:	http://nrl.northumbria.ac.uk/id/eprint/21866

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