Al Turkestani, Mohammed, Durose, Ken, Wakeling, Ben, Lane, David, Irvine, Stuart and Barrioz, Vincent (2009) A Rapid Screening Method for Investigating the Effect of Processing Parameters on CdTe/CdS Solar Cell Performance. MRS Proceedings, 1165. ISSN 1946-4274
Full text not available from this repository. (Request a copy)Abstract
A rapid screening method is reported in which material processing parameters are investigated as a function of the CdTe absorber thickness in CdTe/CdS solar cells. It has been used to investigate i) the optimum absorber thickness for CdCl2 processing at 380°C for 10 mins, and ii) the effect on device performance of post-growth annealing of CdS layer with H2, N2, and O2. It was found that the optimum thickness of CdTe compatible with the processing was ∼3μm. The device results were independent of the post-growth treatment of the CdS for the conditions investigated here. The bevel method allowed for ∼30 data points to be obtained from each sample, this giving a significant advantage over conventional experimental methods.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Cd; Te; S |
| Subjects: | F200 Materials Science |
| Department: | Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering |
| Depositing User: | Becky Skoyles |
| Date Deposited: | 23 Nov 2015 16:21 |
| Last Modified: | 12 Oct 2019 19:06 |
| URI: | http://nrl.northumbria.ac.uk/id/eprint/24706 |
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