Sevim, Semih, Tolunay, Selin and Torun, Hamdi (2015) Micromachined sample stages to reduce thermal drift in atomic force microscopy. Microsystem Technologies, 21 (7). pp. 1559-1566. ISSN 0946-7076
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Official URL: https://doi.org/10.1007/s00542-014-2251-3
| Item Type: | Article |
|---|---|
| Subjects: | H600 Electronic and Electrical Engineering |
| Department: | Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering |
| Depositing User: | Ellen Cole |
| Date Deposited: | 20 Feb 2018 15:47 |
| Last Modified: | 11 Oct 2019 22:00 |
| URI: | http://nrl.northumbria.ac.uk/id/eprint/33440 |
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