Temperature controlled properties of sub-micron thin SnS films

Nwankwo, Stephen, Campbell, Stephen, Ramakrishna Reddy, Kotte, Beattie, Neil, Barrioz, Vincent and Zoppi, Guillaume (2018) Temperature controlled properties of sub-micron thin SnS films. Semiconductor Science and Technology, 33. 065002. ISSN 0268-1242

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Official URL: http://doi.org/10.1088/1361-6641/aabc6f


Tin sulphide (SnS) thin films deposited by thermal evaporation on glass substrates are studied for different substrate temperatures. The increase in substrate temperature results in the increase of the crystallite size and change in orientation of the films. The crystal structure of the film is that of SnS only and for temperatures ≤ 300ºC the films are of random orientation, whereas for higher temperatures the films become (040) oriented. The variation of Sn/S composition was accompanied by a reduction in optical energy bandgap from 1.47 to 1.31 eV as the substrate temperature increases. The Urbach energy was found stable at 0.169 ± 0.002 eV for temperature up to 350ºC. Photoluminescence emission was observed only for films exhibiting stoichiometric properties and shows that a precise control of the film composition is critical to fabricate devices while an increase in grain size will be essential to achieve high efficiency.

Item Type: Article
Uncontrolled Keywords: Thermal evaporation, thin films, tin sulphide, photoluminescence, solar cells
Subjects: F200 Materials Science
H600 Electronic and Electrical Engineering
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Paul Burns
Date Deposited: 12 Apr 2018 13:24
Last Modified: 01 Aug 2021 11:50
URI: http://nrl.northumbria.ac.uk/id/eprint/33951

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