Conduction mechanisms in metal/self-assembled monolayer/metal junction

Etor, David, Dodd, Linzi, Balocco, Claudio and Wood, David (2019) Conduction mechanisms in metal/self-assembled monolayer/metal junction. Micro & Nano Letters, 14 (7). pp. 808-811. ISSN 1750-0443

Conduction mechanisms in metal self-assembled monolayer metal junctions_with minor corrections.pdf - Accepted Version

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The conduction mechanisms in metal-insulator-metal (MIM) junctions where the insulator consists of a self-assembled monolayer are investigated. Temperature dependence measurements from 2.5 to 300 K, show that the conduction is dominated by tunnelling only for temperatures below 20 K, while at higher temperatures surface-limited and bulk-limited mechanisms are observed. The experimental results are explained using a combination of direct (Simmons) tunnelling, Schottky emission, and Poole-Frenkel theory. Further insight is gained through numerical simulations based on the non-equilibrium Green-function formalism.

Item Type: Article
Uncontrolled Keywords: MIM structures; Green's function methods; self-assembly; monolayers; MIM devices; Poole-Frenkel effect; tunnelling
Subjects: H600 Electronic and Electrical Engineering
J500 Materials Technology not otherwise specified
Department: Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering
Depositing User: Paul Burns
Date Deposited: 27 Feb 2019 17:04
Last Modified: 01 Aug 2021 11:21

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