Items where Author is "Chen, Tu Pei"

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Number of items: 12.

Article

Hu, S. G., Wu, Shuangyi, Jia, W. W., Yu, Q., Deng, L. J., Fu, Yong Qing, Liu, Y. and Chen, Tu Pei (2014) Review of Nanostructured Resistive Switching Memristor and Its Applications. Nanoscience and Nanotechnology Letters, 6 (9). pp. 729-757. ISSN 1941 4900

Liu, Yang, Chen, Tu Pei, Ding, L., Zhang, Sam, Fu, Yong Qing and Fung, Steve (2006) Charging mechanism in a SiO[sub 2] matrix embedded with Si nanocrystals. Journal of Applied Physics, 100 (9). 096111. ISSN 0021 8979

Liu, Yang, Chen, Tu Pei, Ng, C. Y., Ding, L., Zhang, Sam, Fu, Yong Qing and Fung, Steve (2006) Depth Profiling of Charging Effect of Si Nanocrystals Embedded in SiO2: A Study of Charge Diffusion among Si Nanocrystals. The Journal of Physical Chemistry B, 110 (33). pp. 16499-16502. ISSN 1520-6106

Liu, Yang, Chen, Tu Pei, Ng, C. Y., Tse, Man Siu, Zhao, P., Fu, Yong Qing, Zhang, Sam and Fung, Steve (2005) Random capacitance modulation due to charging/discharging in Si nanocrystals embedded in gate dielectric. Nanotechnology, 16 (8). pp. 1119-1122. ISSN 0957-4484

Liu, Yang, Chen, Tu Pei, Fu, Yong Qing and Hsieh, Jang-Hsing (2005) Characterization of Si nanocrystals embedded in SiO2 with X-Ray photoelectron spectroscopy. Journal of Metastable and Nanocrystalline Materials, 23. pp. 11-14. ISSN 1422-6375

Liu, Yang, Chen, Tu Pei, Zhao, P., Zhang, Sam, Fung, Steve and Fu, Yong Qing (2005) Memory effect of Al-rich AlN films synthesized with rf magnetron sputtering. Applied Physics Letters, 87 (3). 033112. ISSN 0003 6951

Nicolau, Dan, Liu, Yang, Chen, Tu Pei, Tse, Man Siu, Fu, Yong Qing, Muller, Uwe and Dell, John M. (2004) Evolutions and distributions of Si nanocrystals and other Si oxidation states in Si-implanted SiO2 films. Proceedings of SPIE, 5275. pp. 374-377. ISSN 0277-786X

Chen, Tu Pei, Liu, Yang, Sun, Chang Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Fu, Yong Qing, Liu, Y. C. and Fung, Steve (2004) Core-Level Shift of Si Nanocrystals Embedded in a SiO2 Matrix. The Journal of Physical Chemistry B, 108 (43). pp. 16609-16612. ISSN 1520-6106

Wang, Chien Ming, Hsieh, Jang-Hsing, Fu, Yong Qing, Li, C., Chen, Tu Pei and Lam, U. T. (2004) Electrical properties of TaN–Cu nanocomposite thin films. Ceramics International, 30 (7). pp. 1879-1883. ISSN 0272 8842

Liu, Yang, Fu, Yong Qing, Chen, Tu Pei, Tse, Man Siu, Fung, Steve, Hsieh, Jang-Hsing and Yang, Xiao Hong (2003) Depth Profiling of Si Oxidation States in Si-Implanted SiO2Films by X-Ray Photoelectron Spectroscopy. Japanese Journal of Applied Physics, 42 (Part 2). L1394-L1396. ISSN 0021-4922

Liu, Yang, Chen, Tu Pei, Fu, Yong Qing, Tse, Man Siu, Hsieh, Jang-Hsing, Ho, P. F. and Liu, Y. C. (2003) A study on Si nanocrystal formation in Si-implanted SiO2 films by x-ray photoelectron spectroscopy. Journal of Physics D: Applied Physics, 36 (19). L97-L100. ISSN 0022-3727

Sun, Chang Qing, Tay, Beng Kang, Fu, Yong Qing, Li, Sean, Chen, Tu Pei, Bai, H. L. and Jiang, E. Y. (2003) Discriminating Crystal Binding from the Atomic Trapping of a Core Electron at Energy Levels Shifted by Surface Relaxation or Nanosolid Formation. The Journal of Physical Chemistry B, 107 (2). pp. 411-414. ISSN 1520-6106

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