Items where Author is "Hassan, Muhammad"

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Number of items: 7.

Article

Akbar, Muhammad Ali, Ait Si Ali, Amine, Amira, Abbes, Bensaali, Faycal, Benammar, Mohieddine, Hassan, Muhammad and Bermak, Amine (2016) An Empirical Study for PCA- and LDA-Based Feature Reduction for Gas Identification. IEEE Sensors Journal, 16 (14). pp. 5734-5746. ISSN 1530-437X

Ait Si Ali, Amine, Amira, Abbas, Bensaali, Faycal, Benammar, Mohieddine, Akbar, Muhammad Ali, Hassan, Muhammad and Bermak, Amine (2015) Design and implementation of a gas identification system on Zynq SoC platform. ARPN Journal of Engineering and Applied Sciences, 10 (20). pp. 9758-9764. ISSN 1819-6608

Conference or Workshop Item

Hassan, Muhammad, Umar, Muhammad, Bermak, Amine, Ait Si Ali, Amine and Amira, Abbes (2016) Computationally efficient environmental monitoring with electronic nose: A potential technology for ambient assisted living. In: ISSE 2016 - IEEE International Symposium on Systems Engineering, 3rd - 5th October 2016, Edinburgh, Scotland.

Hassan, Muhammad, Umar, Muhammad, Bermak, Amine, Ait Si Ali, Amine and Amira, Abbes (2016) Quantification of carcinogenic odor of formaldehyde with electronic nose technology. In: ISSE 2016 - IEEE International Symposium on Systems Engineering, 3rd - 5th October 2016, Edinburgh, Scotland.

Ait Si Ali, Amine, Amira, Abbes, Bensaali, Faycal, Benammar, Mohieddine, Hassan, Muhammad and Bermak, Amine (2016) High Level Synthesis Based E-Nose System for Gas Applications. In: FCCM 2016 - 24th Annual International Symposium on Field-Programmable Custom Computing Machines, 1-3 May 2016, Washington, DC, USA.

Hassan, Muhammad, Bermak, Amine, Ait Si Ali, Amine and Amira, Abbes (2015) Gas identification with spike codes in wireless electronic nose: A potential application for smart green buildings. In: IntelliSys 2015 - SAI Intelligent Systems Conference 2015, 10th - 11th November 2015, London, UK.

Hassan, Muhammad, Bermak, Amine, Ait Si Ali, Amine and Amira, Abbes (2014) Gas identification in electronic nose by using similarity measure between latency patterns. In: ICM 2014 - 26th International Conference on Microelectronics, 14th - 17th December 2014, Doha, Qatar.

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