Items where Author is "Murray, J."

Zhang, R., Li, Yifan, Murray, J., Bunting, A., Smith, S., Dunare, C., Stevenson, J., Desmulliez, Marc and Walton, Anthony (2013) Test structures for electrical evaluation of high aspect ratio TSV arrays fabricated using planarised sacrificial photoresist. In: Microelectronic Test Structures (ICMTS), 2013 IEEE International Conference on. IEEE, Piscataway, NJ, pp. 37-42. ISBN 978-1-4673-4845-4