Items where Author is "Smith, Stewart"
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Andreas Tsiamis, Andreas Tsiamis, Li, Yifan, Dunare, Camelia, Marland, Jamie, Blair, Ewen, Smith, Stewart, Terry, Jonathan G., Mitra, Srinjoy, Underwood, Ian, Murray, Alan and Walton, Anthony J. (2020) Comparison of Conventional and Maskless Lithographic Techniques for More than Moore Post-processing of Foundry CMOS Chips. Journal of Microelectromechanical Systems, 29 (5). pp. 1245-1252. ISSN 1057-7157
Wang, Cong, Xu, Bin, Terry, Jonathan, Smith, Stewart, Walton, Anthony, Wang, Steven, Lu, Haibao and Li, Yifan (2019) Flexible, Strain Gated Logic Transducer Arrays Enabled by Initializing Surface Instability on Elastic Bilayers. APL Materials, 7 (3). 031509. ISSN 2166-532X
Wang, Cong, Xu, Bin, Terry, Jonathan, Smith, Stewart, Walton, Anthony and Li, Yifan (2018) Metal-Elastomer Surface Deformation Control on Super-Compressible Strain Transducer Arrays. In: IEEE International Flexible Electronics Technology Conference. IEEE, Piscataway. ISBN 9781538633588
Wang, C., Xu, Ben, Terry, Jonathan, Smith, Stewart, Walton, Anthony and Li, Yifan (2017) Test Structures for Stepwise Deformation Sensing on Super-flexible Strain Sensors. In: Microelectronic Test Structures (ICMTS), 2017 IEEE International Conference on, 27-30 March 2017, Grenoble.
Zou, H., Li, Yifan, Smith, Stewart, Bunting, A., Walton, Anthony and Terry, Jonathan (2012) Modification and characterisation of material hydrophobicity for surface acoustic wave driven microfluidics. In: Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on. IEEE, Piscataway, NJ, pp. 61-65. ISBN 978-1-4673-1027-7
Li, Yifan, Fu, Yong Qing, Winters, D., Flynn, Brian, Parkes, William, Brodie, Douglas, Liu, Yufei, Terry, Jonathan, Haworth, Les, Bunting, Andrew, Stevenson, J., Smith, Stewart, Mackay, Logan, Langridge-Smith, Pat, Stokes, Adam and Walton, Anthony (2012) Test Structures for Characterizing the Integration of EWOD and SAW Technologies for Microfluidics. Semiconductor Manufacturing, IEEE Transactions on, 25 (3). pp. 323-330. ISSN 0894-6507
Gruber, D., Li, Yifan, Smith, Stewart, Tiwari, Abishek, Deng, F., Stokes, Adam, Terry, Jonathan, Bunting, A., Mackay, Logan and Langridge-Smith, Pat (2011) Test structures and a measurement system for characterising the lifetime of EWOD devices. In: Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on. IEEE, Piscataway, NJ, pp. 80-84. ISBN 978-1-4244-8526-0
Mita, Yoshio, Li, Yifan, Kubota, Masanori, Parkes, William, Haworth, Les, Flynn, Brian, Terry, Jonathan, Tang, T., Ruthven, Alec and Smith, Stewart (2008) Wireless driven EWOD technology for a MEMS pond skater. In: 38th European Solid-State Device Research Conference, 2008. ESSDERC 2008. IEEE, Piscataway, NJ, pp. 306-309. ISBN 978-1-4244-2363-7