Jeynes, Chris, Zoppi, Guillaume, Forbes, Ian, Bailey, Melanie and Peng, Nianhua (2009) Elemental depth profiling of thin film chalcogenides using MeV ion beam analysis. In: 5th Photovoltaic Science Applications and Technology (PVSAT-5), 1-3 April 2009, Glyndŵr University, Wrexham, UK.
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Elemental Depth Profiling of Thin Film Chalcogenides Using MeV Ion Beam Analysis.pdf Download (80kB) | Preview |
Abstract
The comprehensive characterisation is one of many technical challenges in the fabrication of photovoltaic devices from novel materials. We show how the application of recent advances in MeV ion beam analysis, providing the selfconsistent treatment of Rutherford backscattering and particle induced X-ray emission spectra, makes a new set of powerful complementary elemental depth profiling techniques available for all thin film technologies, including the chalcopyrite compound semiconductors. We will give and discuss a detailed analysis of a CuInAl metallic precursor film, showing how similar methods are also applicable to other films of interest.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | F200 Materials Science |
| Department: | Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering |
| Related URLs: | |
| Depositing User: | EPrint Services |
| Date Deposited: | 30 Oct 2009 12:49 |
| Last Modified: | 17 Dec 2023 12:02 |
| URI: | https://nrl.northumbria.ac.uk/id/eprint/2612 |
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