An investigation into the effects of pattern geometries on laser trimmed film resistors

Alafogianni, Maria, Birkett, Martin and Penlington, Roger (2017) An investigation into the effects of pattern geometries on laser trimmed film resistors. In: Proceedings of the 2016 International Conference for Students on Applied Engineering (ISCAE). IEEE, Piscataway, pp. 79-82. ISBN 978-1-4673-9053-8

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This study investigates the influence of different trim patterns on the performance of laser trimmed film resistors. A variety of popular trim pattern geometries including the plunge and L-cut were modelled and tested and their effect on resistance value, temperature coefficient of resistance (TCR) and heat-affected-zone (HAZ) sensitivity was investigated. It is shown that variation in resistor dimensions and trim length in the trimming algorithm can increase the TCR of the resistors with results of 100–140 ppm/°C for the plunge cut and 100–130 ppm/°C for the L-cut. It is also found that the L-cut has lower sensitivity in the HAZ with a value of 11% in comparison with the plunge cut with a value of 12% for the same resistor dimensions.

Item Type: Book Section
Uncontrolled Keywords: optimization, laser trimming process, thin film resistors, heat-affected-zone, TCR
Subjects: H300 Mechanical Engineering
Department: Faculties > Engineering and Environment > Mechanical and Construction Engineering
Depositing User: Dr Martin Birkett
Date Deposited: 16 Jan 2017 15:47
Last Modified: 12 Oct 2019 22:27

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