Li, Kun, Lin, Yan, Gibson, Des, Zheng, Yang, Liu, Jiao, Sun, Lu and Fu, Yong Qing (2017) Surface microstructures and corrosion resistance of Ni-Ti-Nb shape memory thin films. Applied Surface Science, 414. pp. 63-67. ISSN 0169-4332
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Abstract
Ni-Ti-Nb and Ni-Ti shape memory thin films were sputter-deposited onto silicon substrates and annealed at 600ºC for crystallization. X-ray diffraction (XRD) measurements indicated that all of the annealed Ni-Ti-Nb films were composed of crystalline Ni-Ti (Nb) and Nb-rich grains. X-ray photoelectron spectroscopy (XPS) tests showed that the surfaces of Ni-Ti-Nb films were covered with Ti oxides, NiO and Nb2O5. The corrosion resistance of the Ni-Ti-Nb films in 3.5 wt. % NaCl solution was investigated using electrochemical tests such as open-circuit potential (OCP) and potentio-dynamic polarization tests. Ni-Ti-Nb films showed higher OCPs, higher corrosion potentials (Ecorr) and lower corrosion current densities (icorr) than the binary Ni-Ti film, which indicated a better corrosion resistance. The reason may be that Nb additions modified the passive layer on the film surface. The OCPs of Ni-Ti-Nb films increased with further Nb additions, whereas no apparent difference of Ecorr and icorr was found among the Ni-Ti-Nb films.
Item Type: | Article |
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Uncontrolled Keywords: | Ni-Ti-Nb, thin film, microstructures, corrosion resistance |
Subjects: | F300 Physics |
Department: | Faculties > Engineering and Environment > Mathematics, Physics and Electrical Engineering |
Depositing User: | Ay Okpokam |
Date Deposited: | 24 Apr 2017 09:01 |
Last Modified: | 31 Jul 2021 20:18 |
URI: | http://nrl.northumbria.ac.uk/id/eprint/30434 |
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