Items where Author is "Gruber, D."

Gruber, D., Li, Yifan, Smith, Stewart, Tiwari, Abishek, Deng, F., Stokes, Adam, Terry, Jonathan, Bunting, A., Mackay, Logan and Langridge-Smith, Pat (2011) Test structures and a measurement system for characterising the lifetime of EWOD devices. In: Microelectronic Test Structures (ICMTS), 2011 IEEE International Conference on. IEEE, Piscataway, NJ, pp. 80-84. ISBN 978-1-4244-8526-0